Publication: An advanced area scaling approach for s...
Master data
| Title: | An advanced area scaling approach for semiconductor burn-in |
| Subtitle: | |
| Abstract: | |
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| Publication type: | Article in journal (Authorship) |
| Publication date: | 01.2015 (Print) |
| Published by: |
Microelectronics Reliability
Microelectronics Reliability
(
Elsevier Science Inc.;
)
to publication |
| Title of the series: | - |
| Volume number: | 55 |
| Issue: | 1 |
| First publication: | Yes |
| Version: | - |
| Page: | pp. 129 - 137 |
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| Publication date: | |
| ISBN (e-book): | - |
| eISSN: | - |
| DOI: | http://dx.doi.org/10.1016/j.microrel.2014.09.007 |
| Homepage: | - |
| Open access |
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| Publication date: | 01.2015 |
| ISBN: | - |
| ISSN: | - |
| Homepage: | - |
Authors
Assignment
| Organisation | Address | ||
|---|---|---|---|
|
Fakultät für Technische Wissenschaften
Institut für Statistik
|
AT - 9020 Klagenfurt am Wörthersee |
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