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Project: EPT300

Master data

German

Title:	EPT300
Description:	Entwickelt werden statistische Methoden und Verfahren zur Prozesskontrolle für die neue 300mm Wafer-Technologie zur Herstellung von Chips für die Automobil- und Industrieelektronik.
Keywords:	optimale Versuchsplanung, bayessche Statistik, statistische Prozesskontrolle

Short title:	n.a.
Period:	01.04.2012 - 08.11.2016
Contact e-mail:	-
Homepage:	-

Employees

Role

Time period

(internal)

Project leader

01.04.2012 - 08.11.2016

(internal)

Research staff

01.04.2012 - 31.03.2015

Assignment

Organisational unit

Fakultät für Technische Wissenschaften

Categorisation

Project type	Research funding (on request / by call for proposals)
Funding type	§27
Research type	Fundamental research Applied research
Subject areas	202028 - Microelectronics
Research Cluster	Energy management and technology
Gender aspects	Genderrelevance not selected
Project focus	Science to Science (Quality indicator: I) Classification raster of the assigned organisational units: Institut für Statistik
working groups	Statistik für Halbleiter

Funding

Funding program

Cooperations

No partner organisations selected

Research activities

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Projects	No related projects
Publications	Decision-Theoretical Model for Failures Which are Tackled by Countermeasures Decision-Theoretical Model for Failures Which are Tackled by Countermeasures (2014) D. Kurz, H. Lewitschnig, J. Pilz IEEE Transactions on Reliability No Publisher selected to publication Advanced Bayesian Estimation of Weilbull Early Life Failure Distributions Advanced Bayesian Estimation of Weilbull Early Life Failure Distributions (2014) D. Kurz, H. Lewitschnig, J. Pilz Quality and Reliability Engineering International No Publisher selected to publication Failure probability estimation with differently sized reference products for semiconductor burn-in Failure probability estimation with differently sized reference products for semiconductor burn-in (2015) D. Kurz, H. Lewitschnig, J. Pilz Applied Stochastic Models in Business and Industry No Publisher selected to publication An advanced area scaling approach for semiconductor burn-in An advanced area scaling approach for semiconductor burn-in (2015) D. Kurz, H. Lewitschnig, J. Pilz Microelectronics Reliability No Publisher selected to publication Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing (2014) D. Kurz, H. Lewitschnig, J. Pilz Proceedings of 2014 Winter Simulation Conference No Publisher selected to publication
Events	No related events
Lectures	Area Scaling of failure probabilities for semiconductor devices Area Scaling of failure probabilities for semiconductor devices H. Lewitschnig, D. Kurz, J. Pilz Österreich since 03.06.2014 To Lecture